Spirox launches fast TGV crack inspection system
AI-summarised brief · reviewed before publication
Semiconductor equipment supplier Spirox Corp has launched its first high-speed glass core substrate inspection system, targeting next-generation packaging technologies like panel-level packaging. The optical system detects microcracks and debris in transparent glass, addressing limitations of traditional tools and improving yield rates for glass core and through-glass via (TGV) technologies. Chairman Peter Chin reported strong interest from customers in Taiwan, Japan, the US, and South Korea. With major firms planning commercialization by 2028, Spirox aims to sell dozens of units next year. The launch supports Spirox’s strategic shift from distributor to developer, aiding its recent turnaround to a net profit of NT$13.64 million. CEO Paul Yang stated the company seeks to increase own-brand equipment revenue share to 80-90 percent. Spirox also assisted Innolux in validating glass core substrates for TSMC’s CoWoS development, signaling growing industry adoption of these advanced packaging solutions.
💡 Why It Matters
- · Spirox’s entry into proprietary inspection hardware validates the commercial viability of glass substrates for high-performance computing.
- · By solving critical yield challenges in TGV manufacturing, the company secures a pivotal role in the supply chain for next-generation AI infrastructure.