semiconductor-digest.com
Nov 12, 2026
Thermo Fisher Scientific Reports Multiple Installations of Optis FIB-SEM Systems
AI-summarised brief · reviewed before publication
Thermo Fisher Scientific announced the completion of several installations of its Optis focused ion beam-scanning electron microscope (FIB‑SEM), a system that automates wafer‑to‑TEM sample preparation using robotics and AI. The technology streamlines sample handling, reduces manual steps, and improves data consistency for semiconductor manufacturers. Field testing over months informed refinements, leading to widespread adoption among leading chipmakers. Optis integrates into existing workflows, offering predictable operation and clearer sample records, supporting the development of increasingly complex chips.
💡 Why It Matters
- · By cutting preparation time and variability, Optis accelerates the feedback loop in chip design, enabling faster iteration and higher yield in advanced logic and memory production.
