Nidec Advance Technology Launches the New AURCA-series, an AI-based Inspection & Measurement Solution for Semiconductors and Printed Substrates
AI-summarised brief · reviewed before publication
Nidec Advance Technology Corporation has launched the AURCA series, an AI-based inspection and measurement solution for semiconductors and printed substrates. The product addresses issues in the manufacturing process, including defect detection and yield improvement. Key features include advanced defect detection, full-color optical inspection, and single, simultaneous processing of images with multiple light sources. The AURCA series offers true-root-cause defect analysis, direct feedback, and a constant yield improvement cycle, contributing to manufacturing cost reduction and product reliability improvement.