​​New ZEISS Crossbeam 750 FIB-SEM for  High-Accuracy Sample Preparation Workflows​
semiconductor-digest.com Apr 1, 2026

​​New ZEISS Crossbeam 750 FIB-SEM for High-Accuracy Sample Preparation Workflows​

AI-summarised brief · reviewed before publication

ZEISS has unveiled the Crossbeam 750 FIB-SEM, a focused ion beam-scanning electron microscope optimized for demanding sample preparation. The system provides a live, high-resolution "see while you mill" view, enabling immediate feedback and eliminating milling interruptions for uniform TEM lamellae and precise FIB cross sections. It delivers sub-nanometer precision and high-fidelity 3D analysis, ideal for advanced semiconductor and materials workflows, including nanofabrication and 3D volume imaging.