Quantum Diamond Magnetic Imaging for Non-Destructive Electrical Fault Localization
AI-summarised brief · reviewed before publication
Fleming Bruckmaier, Co-founder and CTO of QuantumDiamonds GmbH, has developed a new technology called Quantum Diamond Microscopy (QDM) for non-destructive electrical fault localization in advanced chip packages. QDM uses nitrogen-vacancy centers in synthetic diamond to image the magnetic field generated by current flow, revealing defects such as voids, leakage paths, and latch-ups without heat dissipation, sample preparation, or damage to the device. The technology has been commercialized as the QD m.1 and is currently deployed at leading failure analysis laboratories.
💡 Why It Matters
- · The widespread adoption of QDM could accelerate yield ramp by enabling faster root cause identification of buried defects, which are the industry's most common yield-killing failure mode in advanced packaging.