TechCapsules

AI-summarised brief · reviewed before publication

Keysight Technologies partnered with the University of Glasgow, the UK National Physical Laboratory and MPI Corporation to create a single‑sweep broadband test system for sub‑terahertz semiconductor devices. The collaboration demonstrated continuous on‑wafer measurement of indium‑phosphide high‑electron‑mobility transistors from near DC to 250 GHz using Keysight’s PNA‑X vector network analyzer, a 250 GHz frequency extender and a precision source/measure unit, together with MPI’s probing hardware and NPL’s metrology methods. The setup required only one probe touchdown, eliminating multiple calibrations and providing consistent S‑parameter data across the full frequency span. Researchers say the approach simplifies data collection for millimeter‑wave and sub‑THz transistor modeling, accelerating development of next‑generation chips. Effort also validated system’s filtering and power calibration, ensuring signal purity at probe tip.